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Chin. Opt. Lett.
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Characterization of multilayers and their interlayers: applicationto Co-based systems      PDF
  • Chin. Opt. Lett., 2013, 11(s1): pp.S10601
  • P. Jonnard, Z.-S. Wang, J.-T. Zhu, C. Meny, J.-M. Andre, M.-H. Hu, K. Le Guen
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    Refractive index inhomogeneity of LaF3 film at deep ultraviolet wavelength      PDF
  • Chin. Opt. Lett., 2013, 11(s1): pp.S10602
  • Dawei Lin, Chun Guo, Bincheng Li
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    Optical performance, structure and thermal stability of Al(1wt.-%Si)/Zr and Al(pure)/Zr multilayers designed for the 17–19 nm range      PDF
  • Chin. Opt. Lett., 2013, 11(s1): pp.S10603
  • Qi Zhong, Wenbin Li, Zhong Zhang, Jingtao Zhu, Qiushi Huang, Haochuan Li, Zhanshan Wang, Philippe Jonnard, Karine Le Guen, Yanyan Yuan, Jean-Michel Andre, Hongjun Zhou, Tonglin Huo
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    Interface engineering to decrease interdif fusion and improve thermal stability of EUV multilayer      PDF
  • Chin. Opt. Lett., 2013, 11(s1): pp.S10604
  • Bo Yu, Shangqi Kuang, Chun Li, Chunshui Jin
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    Method to accurate calibrate deposition rates of EUV multilayer coatings      PDF
  • Chin. Opt. Lett., 2013, 11(s1): pp.S10605
  • Lichao Zhang, Jinsong Gao
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    Multilayers with high-reflectivity at 19.5 nm and low-reflectivity at 30.4 nm      PDF
  • Chin. Opt. Lett., 2013, 11(s1): pp.S10606
  • Li Jiang, Jingtao Zhu, Zhong Zhang, Zhanshan Wang, Michael Trubetskov, Alexander V. Tikhonravov
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    Determination of optical constants in DUV/VUV      PDF
  • Chin. Opt. Lett., 2013, 11(s1): pp.S10607
  • Chun Guo, Mingdong Kong, Dawei Lin, Cunding Liu, Weidong Gao, Bincheng Li
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