2018-11-17 Welcome guest,  Sign In  |  Sign Up
Chin. Opt. Lett.
 Home  List of Issues    Issue 10 , Vol. 16 , 2018    10.3788/COL201816.102401


Optical rectification in surface layers of germanium
Li Zhang1, Fangye Li1, Shuai Wang1, Qi Wang1, Kairan Luan1, Xi Chen1, Xiuhuan Liu2, Lingying Qiu3, Zhanguo Chen1, Jihong Zhao1, Lixin Hou4, Yanjun Gao1, and Gang Jia1
1 State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, [Jilin University], Changchun 1 3001 2, China
2 College of Communication Engineering, [Jilin University], Changchun 130012 , China
3 State Key Laboratory of Supramolecular Structure and Materials, Institute of Theoretical Chemistry, [Jilin University], Changchun 13 0012, China
4 College of Information Technology, [Jilin Agricultural University], Changchun 130118, China

Chin. Opt. Lett., 2018, 16(10): pp.102401

DOI:10.3788/COL201816.102401
Topic:Optics at surfaces
Keywords(OCIS Code): 240.4350  190.4350  190.4720  

Abstract
In this Letter, we have demonstrated significant electric field induced (EFI) optical rectification (OR) effects existing in the surface layers of germanium (Ge) and measured the distributions of EFI OR signals along the normal directions of surface layers of Ge samples. Based on the experimental results, the ratios of the two effective second-order susceptibility components χzzz(2eff)/χzxx(2eff) for Ge(001), Ge(110), and Ge(111) surface layers can be estimated to be about 0.92, 0.91, and 1.07, respectively. The results indicate that the EFI OR can be used for analyzing the properties on surface layers of Ge, which has potential applications in Ge photonics and optoelectronics.

Copyright: © 2003-2012 . This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

 View PDF (503 KB)

Share:


Received:2018/7/5
Accepted:2018/8/17
Posted online:2018/9/19

Get Citation: Li Zhang, Fangye Li, Shuai Wang, Qi Wang, Kairan Luan, Xi Chen, Xiuhuan Liu, Lingying Qiu, Zhanguo Chen, Jihong Zhao, Lixin Hou, Yanjun Gao, and Gang Jia, "Optical rectification in surface layers of germanium," Chin. Opt. Lett. 16(10), 102401(2018)

Note: This work was partially supported by the National Natural Science Foundation of China (Nos. 61474055 and 60976043) and the National 863 Program of China (No. 2009AA03Z419).



References

1. F. K. Hopkins, SPIE Newsroom (2013).

2. R. A. Soref, Nat. Photon. 4, 495 (2010).

3. R. A. Soref, S. J. Emelett, and W. R. Buchwald, J. Opt. A: Pure Appl. Opt. 8, 840 (2006).

4. J. H. Zhao, Q. D. Chen, Z. G. Chen, G. Jia, W. Su, Y. Jiang, Z. X. Yan, T. V. Dolgova, O. A. Aktsipeteov, and H. B. Sun, Opt. Lett. 34, 3340 (2009).

5. J. Qi, M. S. Yeganeh, I. Koltover, and A. G. Yodh, Phys. Rev. Lett. 71, 633 (1993).

6. J. E. Sipe, D. J. Moss, and H. M. van Driel, Phys. Rev. B 35, 1129 (1987).

7. G. Lüpke, C. Meyer, C. Ohlhoff, and H. Kurz, Opt. Lett. 20, 1997 (1995).

8. A. Bouhelier, M. Beversluis, A. Hartschuh, and L. Novotny, Phys. Rev. Lett. 90, 013903 (2003).

9. O. A. Aktsipetrov, A. A. Fedyanin, A. V. Melnikov, E. D. Mishina, A. N. Rubtsov, M. H. Anderson, P. T. Wilson, M. Ter Beek, X. F. Hu, J. I. Dadap, and M. C. Downer, Phys. Rev. B 60, 8924 (1999).

10. S. L. Chuang, S. Schmitt-Rink, B. I. Greene, P. N. Saeta, and A. F. J. Levi, Phys. Rev. Lett. 68, 102 (1992).

11. M. Reid, and R. Fedosejevs, Appl. Phys. Lett. 86, 011906 (2005).

12. L. Peters, J. Tunesi, A. Pasquazi, and M. Peccianti, Nano Energy 46, 128 (2018).

13. Z. G. Chen, J. X. Zhao, Y. H. Zhang, G. Jia, X. H. Liu, C. Ren, W. Q. Wu, J. B. Sun, K. Cao, S. Wang, and B. Shi, Appl. Phys. Lett. 92, 251111 (2008).

14. J. C. Zhu, G. Jia, X. H. Liu, J. B. Sun, Z. P. Zhang, J. X. Zhao, J. B. Mou, and Z. G. Chen, Infrared Laser Eng. 40, 1485 (2011).

15. Q. Wang, L. Zhang, X. Wang, H. Y. Quan, Z. G. Chen, J. H. Zhao, X. H. Liu, L. X. Hou, Y. J. Gao, G. Jia, and S. W. Chen, Chin. Opt. Lett. 15, 062401 (2017).

16. Q. Wang, H. Zhang, N. Liu, B. J. Zhao, X. H. Liu, L. X. Hou, Y. J. Gao, G. Jia, and Z. G. Chen, Chin. Opt. Lett. 14, 012301 (2016).

17. J. C. Zhu, Z. G. Chen, X. H. Liu, Y. J. Gao, J. B. Mou, Z. Y. Wang, W. Han, and G. Jia, Opt. Laser Tech. 44, 582 (2012).

18. J. C. Zhu, Z. G. Chen, X. H. Liu, J. B. Mou, Y. J. Gao, W. Han, and G. Jia, Chin. Opt. Lett. 10, 082301 (2012).

19. X. H. Liu, Z. G. Chen, G. Jia, X. T. Zhang, and Y. H. Zhang, Acta Opt. Sin. 25, 1391 (2005).


Save this article's abstract as
Copyright©2018 Chinese Optics Letters 沪ICP备15018463号-7 公安备案沪公网安备 31011402005522号