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Chin. Opt. Lett.
 Home  List of Issues    Issue 08 , Vol. 15 , 2017    10.3788/COL201715.081301

Polarization insensitive arrayed-input spectrometer chip based on silicon-on-insulator echelle grating
Minyue Yang, Mingyu Li, and Jianjun He
State Key Laboratory of Modern Optical Instrumentation, Centre for Integrated Optoelectronics, College of Optical Science and Engineering, [Zhejiang University], Hangzhou 310027, China

Chin. Opt. Lett., 2017, 15(08): pp.081301

Topic:Integrated optics
Keywords(OCIS Code): 130.3120  130.7408  050.1950  

We demonstrate a polarization insensitive arrayed-input spectrometer using echelle diffraction grating (EDG) for hyperspectral imaging. The EDG consists of 65 input waveguides and 129 output waveguides, allowing spectral measurements of 65 image pixels at a time when used in combination with a micro-electromechanical system micro mirror array. The spectral resolution reaches 7.8 nm for wavelengths ranging from 1250 to 1700 nm. The measured loss is ?2?dB, and the crosstalk is lower than ?20?dB. The 3 μm silicon-on-insulator platform provides the device with polarization insensitive characteristics. The chip size is only 6?mm×10?mm.

Copyright: © 2003-2012 . This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

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Posted online:2017/5/12

Get Citation: Minyue Yang, Mingyu Li, and Jianjun He, "Polarization insensitive arrayed-input spectrometer chip based on silicon-on-insulator echelle grating," Chin. Opt. Lett. 15(08), 081301(2017)

Note: This work was supported by the Industrial Projects of Public Welfare Technology Research (No. 2014C31088) and the National Natural Science Foundation of China (No. 61535010).


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